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Damian Korus
MNMT-DUBLIN
Examination of AFM probes using electron microscopy; Development of new AFM probes; Working with two dimensional materials like graphene, molybdenum disulfide and black phosphorous; Focused electron beam etching and deposition; Fatigue testing of metals
A quantitative investigation of the physical characteristics of C-AFM probes that govern the accuracy of C-AFM measurements and the development of improved C-AFM probes.
Damian Korus
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